VC04LC18V500RM [KYOCERA AVX]

Varistor, 18V, 0.02J, Surface Mount, CHIP, 0402;
VC04LC18V500RM
型号: VC04LC18V500RM
厂家: KYOCERA AVX    KYOCERA AVX
描述:

Varistor, 18V, 0.02J, Surface Mount, CHIP, 0402

电阻器
文件: 总3页 (文件大小:50K)
中文:  中文翻译
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StaticGuard  
AVX Multilayer Ceramic Transient Voltage Suppressors  
ESD Protection for CMOS, Bi Polar and SiGe Based Systems  
GENERAL INFORMATION  
Typical ESD failure voltage for CMOS and/or Bi Polar  
is 200V.  
Low capacitance (<200pF) is required for high-speed  
data transmission.  
15kV ESD pulse (air discharge) per IEC 1000-4-2,  
Level 4, generates < 20 millijoules of energy.  
Low leakage current (IL) is necessary for battery  
operated equipment.  
StaticGuard  
AVX  
Part Number  
Working Working Clamping  
Test  
Current  
For VC  
Maximum  
Leakage  
Current  
Transient  
Energy  
Rating  
Peak  
Current  
Rating  
Typical  
Cap  
Case  
Size  
Elements  
Voltage Voltage  
Voltage  
(DC)  
(AC)  
VC04LC18V500 _ _  
VC06LC18X500 _ _  
VC08LC18A500 _ _  
VC12LC18A500 _ _  
VA10LC18A500 _ _  
18.0  
14.0  
50  
50  
50  
50  
50  
1
1
1
1
1
10  
10  
10  
10  
10  
0.02  
0.05  
0.10  
0.10  
0.10  
15  
30  
30  
30  
30  
40  
50  
0402  
0603  
0805  
1206  
Axial  
1
1
1
1
1
18.0  
18.0  
18.0  
18.0  
14.0  
14.0  
14.0  
14.0  
80  
200  
200  
Termination/Lead Finish Code  
Packaging Code  
VW (DC) DC Working Voltage (V)  
VW (AC) AC Working Voltage (V)  
VC  
IVC  
Clamping Voltage (V @ IVC )  
Test Current for VC (A, 8x20µS)  
IL  
ET  
Maximum Leakage Current at the Working Voltage (µA)  
Transient Energy Rating (J, 10x1000µS)  
IP  
Peak Current Rating (A, 8x20µS)  
Cap  
Typical Capacitance (pF) @ frequency specified and 0.5 V  
PART NUMBER IDENTIFICATION  
Chips  
Axials  
V C 08 LC 18 A 500 R P  
TERMINATION FINISH:  
P = Ni/Sn Alloy (Plated)  
M = Ni/Sn Pb (Plated)  
V A 10 LC 18 A 500 R L  
LEAD FINISH:  
L = Copper Clad Steel,  
Solder Coated  
PACKAGING (Pcs/Reel)  
CLAMPING VOLTAGE  
ENERGY RATING  
PACKAGING (Pcs/Reel)  
CLAMPING VOLTAGE  
ENERGY RATING  
WORKING VOLTAGE (0-18VDC)  
LOW CAPACITANCE DESIGN  
CASE SIZE DESIGNATOR  
CASE STYLE  
WORKING VOLTAGE (0-18VDC)  
LOW CAPACITANCE DESIGN  
CASE SIZE DESIGNATOR  
CASE STYLE  
PRODUCT DESIGNATOR  
PRODUCT DESIGNATOR  
19  
StaticGuard  
AVX Multilayer Ceramic Transient Voltage Suppressors  
ESD Protection for CMOS, Bi Polar and SiGe Based Systems  
TYPICAL PERFORMANCE DATA  
StaticGuard ESD RESPONSE  
IEC 1000-4-2 (8 Kv Contact Discharge)  
VC06LC18X500 Capacitance Histogram  
50  
45  
40  
35  
30  
30%  
25%  
20%  
VC08LC18A500  
VC12LC18A500  
VC06LC18X500  
15%  
10%  
5%  
0%  
45  
50  
55  
60  
65  
1
10  
100  
1000  
10000  
Capacitance (pF @ 1MHz & 0.5V)  
Number of ESD Strikes  
Measured Data  
Calculated  
VC08LC18A500 Capacitance Histogram  
StaticGuard S21  
DB  
0
14%  
14%  
12%  
VC12LC18A500  
VC08LC18A500  
12%  
-10  
-20  
-30  
-40  
10%  
8%  
6%  
4%  
2%  
0%  
10%  
8%  
6%  
4%  
2%  
0%  
VC06LC18X500  
61 63  
65 67 69 71 73 75 77 79 81 83 85 87 89  
Capacitance (pF)  
0
500  
1000  
1500  
2000  
2500  
Frequency (MHz)  
1MHz, 0.5VRMS  
Measured Data  
Calculated Distribution  
VC12LC18A500 Capacitance Histogram  
VI Curves - StaticGuard Products  
100  
14%  
14%  
80  
60  
40  
12%  
12%  
10%  
8%  
6%  
4%  
2%  
0%  
10%  
8%  
6%  
4%  
2%  
0%  
20  
0
10-9  
10-6  
10-3  
10+0  
10+3  
161 163 165 167 169 171 173 175 177 179 181 183 185 187 189  
Capacitance (pF)  
Current (A)  
1MHz, 0.5VRMS  
Measured Data  
Calculated Distribution  
06LC  
08LC  
12LC  
10LC  
20  
StaticGuard  
AVX Multilayer Ceramic Transient Voltage Suppressors  
TYPICAL PERFORMANCE CURVES (0402 CHIP SIZE)  
VOLTAGE/CURRENT CHARACTERISTICS PULSE DEGRADATION  
Multilayer construction and improved grain structure result in  
excellent transient clamping characteristics up to 20 amps  
peak current, while maintaining very low leakage currents  
under DC operating conditions. The VI curves below show the  
voltage/current characteristics for the 5.6V, 9V, 14V, 18V and  
low capacitance StaticGuard parts with currents ranging from  
parts of a micro amp to tens of amps.  
Traditionally varistors have suffered degradation of electrical  
performance with repeated high current pulses resulting in  
decreased breakdown voltage and increased leakage cur-  
rent. It has been suggested that irregular intergranular  
boundaries and bulk material result in restricted current  
paths and other non-Schottky barrier paralleled conduction  
®
paths in the ceramic. Repeated pulsing of TransGuard tran-  
sient voltage suppressors with 150Amp peak 8 x 20µS  
waveforms shows negligible degradation in breakdown  
voltage and minimal increases in leakage current. This  
®
does not mean that TransGuard suppressors do not suffer  
degradation, but it occurs at much higher current.  
100  
VC04LC18V500  
VC040218X400  
VC040214X300  
VC040209X200  
VC040205X150  
80  
60  
40  
ESD TEST OF 0402 PARTS  
35  
VC04LC18V500  
30  
20  
0
25  
VC040218X400  
10-9  
10-7  
10-5  
10-3  
10-1  
10  
103  
105  
Current (A)  
20  
VC040214X300  
15  
VC040209X200  
PEAK POWER VS PULSE DURATION  
10  
1300  
VC040205X150  
1200  
1100  
5
10  
100  
1000  
10000  
8kV ESD STRIKES  
VC040218X400  
VC040214X300  
1000  
VC040209X200  
INSERTION LOSS CHARACTERISTICS  
900  
VC04LC18V500  
0
VC040205X150  
800  
700  
600  
500  
400  
300  
200  
100  
0
-5  
-10  
VC04LC18V  
VC040218X  
-15  
VC040214X  
VC040209X  
VC040205X  
-20  
-25  
0.01  
0.1  
1
10  
10  
100  
IMPULSE DURATION (μS)  
1000  
Frequency (GHz)  
21  

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